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Brand Name : Topfer
Model Number : Top-Smart 2000
Place of Origin : China
MOQ : one set
Price : to be discussed
Payment Terms : T/T
Supply Ability : 10 sets /30 days
Delivery Time : 2 to 3 weeks
Packaging Details : wooden crate
Color : gray
simultaneously measurable : 4-16 power supply products
Altitude : 1.7m
Customizable : Yes
Product Usage : Automatic Testing for Adapter Products
Function : Rapidly test the performance of various power supply products.
Factory direct sales power supply ATE with high-voltage test power supply, automatic tester, battery comprehensive tester
The eight benefits of the automatic power supply testing system are:
1. Fast speed, high efficiency and strong reliability;
2. Large-scale production can significantly reduce the usage cost (compared with manual testing).
3. It can automatically generate test reports for convenient reference at any time.
4. Possess statistical analysis capabilities for defective products and can assist engineers in analyzing the causes of defective products
5. The system design is flexible and can be customized according to the customer's own needs.
6. Stable and reliable, select the best equipment combination to complete various tests;
7. The price of the power supply testing system is controllable. According to the customer's own needs, they can choose some testing equipment with the best cost performance during use to reduce the price of the entire system.
8. Economical and cost-effective, the customer's existing suitable equipment can be applied to the power supply testing system, avoiding the waste of the original equipment caused by the customer's equipment update.
Open
• An open hardware platform that allows for the addition or removal of various testing devices according to customer needs (including devices with GPIB, RS-232, USB interfaces, etc.)
• The ATE power supply testing system supports simultaneous testing of multiple single-group/multiple-group output power supplies, significantly increasing production line capacity.
• An open software platform, the ATE power supply testing system can be expanded with new test items and functions based on customer testing requirements.
• The ATE power supply testing system supports simultaneous multi-lane barcode pre-scanning and scanning during testing, enhancing overall testing speed.
Universal
• The ATE power supply testing system supports testing of various power supplies (LED power supplies, adapters/chargers, PC power supplies, inverters, communication power supplies, etc.)
• Complies with ENERGY STAR and IEC 62301 measurement requirements.
• Supports Manufacturing Information System (ShopFloor) interface.
• The ATE power supply testing system supports testing of various power parameters under CV, CC, CR, LED modes.
• Optimizes display mode, allowing for any combination of hardware configurations.
High-Speed
• The ATE power supply testing system supports simultaneous testing of multiple single-group/multiple-group output power supplies, significantly increasing production line capacity. (The testing speed for LED power supplies/adapters/chargers is more than double that of the widely used 6000 series power automatic systems.)
• Conducts parallel barcode scanning during testing, greatly improving testing speed.
Top-Smart 2000 ATE Power Supply Testing System Test Items:
| Test items | Comprehensive Test items | 
| CEC test | Short circuit test | 
| DC Current under C.V.Mode | Short circuit current | 
| Peak-Peak noise | OV protection | 
| Serial reaction time test | UV protection | 
| Transient response time | OL protection | 
| Transient spike | OP protection | 
| Tracking | In-test adjustment test | 
| Voltage regulation | AC cycle drop out | 
| Current regulation | PLD simulation | 
| Turn ON time | DC output current test | 
| Rise time | DC output voltage test | 
| Fall time | Waveform read test | 
| Hold-up time | Input impulse current test | 
| Inrush current test | Input power | 
| Power good signal | Relay control | 
| Power fail signal | Bar code scan | 
| P/S ON signal | Dynamic test | 
| Power up sequence | Specification under C.P.Mode | 
| Power off sequence | Input Peak current | 
| Effciency test | Additional expansion measurement test | 
| Overall stability test | Input RMS current | 
| Fan Speed test | TTL signal control | 
| Input power factor | LAN read/write | 
| Input voltage ramp | RS485 read/write | 
| Input freq. ramp | USB read/write | 
| Extend the measurement test | 232 read/write | 
| Automatic test | GPIB read/write | 

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